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Cisco ONS 15454 Series Multiservice Provisioning Platforms

Cisco ONS 15454 SDH TL1 Test Access, Release 4.6

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Quick Start Guide

Table Of Contents

Cisco ONS 15454 SDH TL1 Test Access

Test Access

TL1 Interface Commands

TAP Creation/Deletion

ED-<rr>

TAP Connections

CONN-TACC-<rr>

Change Access Mode

CHG-ACCMD-<rr>

Retrieving TAP Information

RTRV-<rr>

RTRV-TACC

Disconnect a TAP

DISC-TACC

Test Access Configurations

Test Access Mode Definitions

Intrusive and Non-Intrusive Modes

MONE

MONF

MONEF

SPLTE

SPLTF

SPLTEF

LOOPE

LOOPF

SPLTA

SPLTB

Unmapped AID TAP Connections

Parameter Types

TACC_MODE

MOD_TACC

TAPTYPE

Test Access Terminology


Quick Start Guide

Cisco ONS 15454 SDH TL1 Test Access


1 Test Access

The test access (TACC) feature allows a third-party Broadband Remote Test Unit (BRTU) to create non-intrusive test access points (TAPs) to monitor the circuits on the ONS 15454 SDH for errors. The test access feature also allows the circuit to be split (intrusive), so that the transmission paths can be tested for bit errors via the use of various bit test patterns. The two BRTUs supported by the ONS 15454 SDH are the Hekimian/Spirent BRTU-93 (6750) and the TTC/Acterna Centest 650.

The test access functionality provides TL1 commands for creating and deleting TAPs, connecting or disconnecting TAPs to circuit cross-connects and changing the mode of test access on the ONS 15454 SDH. You can view test access information in CTC; in node view click the Maintenance > Test Access tabs.

A TAP provides the capability to connect the circuit under test to a BRTU. This connection initially provides in-service monitoring capability to permit the tester to determine that the circuit under test is idle. The monitor connection should not disturb the circuit under test. The access point and remote test unit (RTU) also provide the capability of splitting a circuit under test. A split consists of breaking the transmission path of the circuit under test. This is done out of service. The two sides of the access point are called the Equipment (E) and Facility (F) directions. For a 4-wire or 6-wire circuit, the transmission pairs within the access point are defined as the A and B pairs. The circuit under test should be wired into the access point so the direction of transmission on the A pair is from E to F, and the transmission direction for the B pair is from F to E (Figure 1).

Figure 1 Circuit with no access (dual FAD TAP)

A dual FAD (facility access digroup) TAP uses twice the bandwidth of the circuit under test. This can be specified by the TAPTYPE parameter as shown in ED-<MOD2> command syntax in the "ED-<rr>" section. The values are SINGLE/DUAL. It defaults to DUAL.

A single FAD TAP uses half the bandwidth as that of the dual FAD i.e., it will use the same bandwidth as the circuit accessed for the TAP creation. This can be specified by the TAPTYPE parameter as shown in the "ED-<rr>" section. The values are SINGLE/DUAL. The MONEF, SPLTEF, LOOPEF modes are not supported by Single FAD TAPs (Figure 2).

Figure 2 Circuit with no access (single FAD TAP)

2 TL1 Interface Commands

TL1 supports commands to create, delete, connect, change, retrieve, and disconnect TAPs.

TAP Creation/Deletion

ED-<rr>

The edit command (ED-<rr>) is used to change an existing Port/VC to a TAP.

ED- (E1, E3, DS3I, VC12, VC3, VC4, VC42C, VC43C, VC44C, VC48C, VC416C, VC464C):[<TID>]:<AID>:<CTAG>[:::TACC=<TACC>],[TAPTYPE=<TAPTYPE>];

Edit an existing Port/ VC and change it to a TAP so it can be used when requesting TACC connections. This includes an optional parameter TACC=n that defines the port/VC as a test access point with a selected unique TAP number. This TAP number will be used when requesting test access connections to circuit cross-connects under test. The TAP creation will fail if the port/VCn already has a cross-connect on it.

The TAPTYPE parameter's values are SINGLE/DUAL. The MONEF, SPLTEF, LOOPEF modes are not supported by single FAD TAPs. It defaults to DUAL.


Note This command generates a REPT DBCHG message.



Note The alarms and conditions on TACC paths can be retrieved by the RTRV-ALM-ALL or RTRV-ALM-<MOD2> commands.



Note The TAP is a persistent object; it will exist even after the user has logged out of the TL1 session.


The following apply to TAP numbers:

1. A TAP number is an integer in the range of 1-999. When TACC=0 is specified, the TAP is deleted (if already present).

2. A TAP number is unique across E1/E3/VC12/VC3/VC4/DS3I TAPs in the system.

3. A TAP number is not editable.

ED-E1

When an ED-E1 is executed with a specified TACC value for a given E1 port/facility, a DFAD (dual facility access digroup) is created by using the specified port/facility and the consecutive port/facility. The command in Example 1 creates a DFAD on FAC-1-1 and FAC-1-2.

Example 1 ED-E1::FAC-1-1:12:::TACC=1;

DV9-99 1970-01-02 03:16:11
M 12 COMPLD
;


Note These ports/facilities cannot be used for the creation of cross-connections until the TAP is deleted.


ED-E3

When an ED-E3 is executed with a specified TACC value for a given E3 port/facility, a DFAD is created by using the specified port/facility and the consecutive port/facility. The command in Example 2 creates an E3 DFAD on FAC-2-1 and FAC-2-2.

Example 2 ED-E3:: FAC-2-1:12:::TACC=2;

DV9-99 1970-01-02 03:16:11
M 12 COMPLD
;


Note These ports/facilities cannot be used for the creation of cross-connections until the TAP is deleted.


ED-DS3I

The ED-DS3I command is used for DS3 access on a DS3I card. When an ED-DS3I is executed with a specified TACC value for a given DS3I, a DFAD is created by using the specified facility and the consecutive port/facility. The command in Example 3 creates DFAD on FAC-16-1 and FAC-16-1.

Example 3 ED-DS3I::FAC-16-1:12:::TACC=3;

DV9-99 1970-01-02 03:16:11
M 12 COMPLD
;


Note These ports/facilities cannot be used for the creation of cross-connections until the TAP is deleted.


ED-VC4n

When an ED-VC4n is executed for a TACC it assigns the VC path for the first 2 -way test access connection and VC+1 as the 2nd 2-way connection. Similarly, for VC42c, VC43c, VC44c, VC48c, VC416c next consecutive VC of same width is chosen. The TAP creation will fail if either of the consecutive VC's are not available. The command in Example 4 creates a TAP on VC4-5-1-1 and VC4-5-1-2.

Example 4 ED-VC4::VC4-5-1-1:12:::TACC=4;

DV9-99 1970-01-02 03:16:11
M 12 COMPLD
;


Note These VC paths cannot be used for creation of cross-connects until the TAP is deleted.


The command in Example 5 creates a VC48C Dual TAP on VC4-6-1-1 and VC4-6-1-25.

Example 5 ED-VC48C::VC4-6-1-1:12:::TACC=5;

DV9-99 1970-01-02 03:16:11
M 12 COMPLD
;


Note These VC paths cannot be used for creation of cross-connects until the TAP is deleted.


ED-VC12

When an ED-VC12 is executed for a TACC a VC12 TAP is created. The specified VC12 AID is taken as the first VC12 connection, and the consecutive VC12 connection is used for as the second path for the TAP.

For example on a E1 card:

Example 6 ED-VC12::VC12-1-1-1-1-1:12:::TACC=6;

DV9-99 1970-01-02 03:16:11
M 12 COMPLD
;

This creates a VC12 TAP on VC12-1-1-1-1-1 and VC12-1-1-1-2-1. These VC's cannot be used for creation of cross-connects until the TAP is deleted.

ED-VC3

When an ED-VC3 is executed for a TACC a VC3 TAP is created. The specified VC3 AID is taken as the first VC3 connection, and the consecutive VC3 connection is used for as the second path for the TAP.

For example on an E3 card:

Example 7 ED-VC3::VC3-1-1-1:12:::TACC=6;

DV9-99 1970-01-02 03:16:11
M 12 COMPLD
;

This creates a VC3 TAP on VC3-1-1-1 and VC3-1-1-2. These VC's cannot be used for creation of cross-connects until the TAP is deleted.

TAP Connections

CONN-TACC-<rr>

The CONN-TACC command (CONN-TACC-<rr>) is used to make a connection between the TAP and the circuit or cross-connect under test.

CONN-TACC-(E1, E3, DS3I, VC12, VC3, VC4, VC42c, VC43c, VC44c, VC48c, VC416c, VC464c):[<TID>]:<AID>:<CTAG>::<TAP>:MD=<MD>;

Connect the port/VC4n/VC3 defined by <AID> to the port/VC4n/VC3 defined by the <TAP> number. The Mode of Test Access to the circuit/cross-connect is specified by <md>. The modes can be either of monitor (non-intrusive), Split or Loop (intrusive) modes. The various modes are described in the "Test Access Configurations" section.


Note The connection is maintained only for the duration of the TL1 session. (Non-persistent).



Note The TAP Number is displayed at the output if the CONN-TACC command completes successfully.


Table 1 shows the error codes supported by the CONN-TACC-<rr> command.

Table 1 Supported Error Codes for CONN-TACC-<rr>

Error Code
Definition

RTBY

REQUESTED TAP BUSY

RTEN

REQUESTED TAP DOES NOT EXIST

SCAT

CIRCUIT IS ALREADY CONNECTED TO ANOTHER TAP

SRCN

REQUESTED CONDITION ALREADY EXISTS

IIAC

INVALID ACCESS IDENTIFIER (AID)

EANS

ACCESS NOT SUPPORTED

SRAC

REQUESTED ACCESS CONFIGURATION IS INVALID


Example 8 CONN-TACC-E1::FAC-1-3:12::1:MD=MONE;

DV9-99 1970-01-02 02:51:54
M 12 COMPLD
1
;

This creates a connection between TAP with number 1 and the port/facility FAC-1-3 with access mode as MONE. The various modes are explained in detail in the "Test Access Mode Definitions" section.

Change Access Mode

CHG-ACCMD-<rr>

CHG-ACCMD- (E1, E3, DS3I, VC12, VC3, VC4, VC42c, VC43c, VC44c, VC48c, VC416c, VC464c):[<TID>]:<TAP>:<CTAG>::<MD>;

Change the type of test access. This may be a change from monitoring the data to inserting data into the VC. This command can only be applied to an existing TAP connection. If one does not exist a RTEN error is returned.

Table 2 shows the error codes supported by the CHG-ACCMD-<rr> command.

Table 2 Supported Error Codes for CHG-ACCMD-<rr>

Error Code
Definition

SRCN

REQUESTED CONDITION ALREADY EXISTS

SRAC

REQUESTED ACCESS CONFIGURATION IS INVALID

RTEN

REQUESTED TAP DOES NOT EXIST


Example 9 CHG-ACCMD-E1::1:12::LOOPE;

DV9-99 1970-01-02 02:59:43
M 12 COMPLD
;


Note This changes the access mode of TAP 1 to LOOPE.



Note The access mode cannot be changed if the TAP is not connected.



Note This command generates a REPT DBCHG message.


Retrieving TAP Information

RTRV-<rr>

RTRV- (E1, E3, DS3I, VC12, VC3, VC4, VC42c, VC43c, VC44c, VC48c, VC416c, VC464c):[<TID>]:<AID>:<CTAG>;

These commands are modified to include the return of a TAP number if the requested <AID> is defined as a TAP. An optional TACC=<TAPNUMBER> will be displayed in the output list if the requested <AID> is defined as a TAP. The TAPTYPE is supported starting with R4.6.

Example 10 RTRV-E1::FAC-1-1:D;

VA454E-96 2003-04-24 20:06:46
M D COMPLD
"FAC-1-1::LINECDE=HDB3,FMT=E1-MF,TACC=1,TAPTYPE=DUAL,SOAK=32:OOS,"
;

Table 3 shows parameters for the RTRV-<rr> command.

Table 3 RTRV-<rr> Parameters

Parameter
Definition

<TID>

The node name which is optional

<TAP>

Number from 1 to 999 identifying the Test Access Point. Returned by the CONN-TACC command. A TAP value of 0 means destroy the TAP. TAP is an integer

<CTAG>

Required identifier or number limited to 6 ASCII characters, correlates response with command

<MD>

Defines the monitor or split mode: MONE, MONF, MONEF, SPLTE, SPLTF, LOOPE, LOOPF, SPLTA, SPLTB, SPLTEF (SPLTE, SPLTF, LOOPE and LOOPF require an external QRS input signal)

<TACC>

Specific block should be set to TACC=n where n is the desired TAP number. Marks the VCn as used for test access.


RTRV-TACC

RTRV-TACC:[<TID>]:<TAP>:<CTAG>;

This command can also be used to retrieve details associated with a TAP. The TAP is identified by the TAP number. The ALL input TAP value means that the command will return all the configured TACCs in the NE.

Example 11 RTRV-TACC:CISCO:241:CTAG;

TID-000 1998-06-20 14:30:00
M 001 COMPLD
"241:STS-2-1-1.STS-2-2,MONE,STS-12-1-1,STS-13-1-1"
;

Table 4 shows parameters for the RTRV-TACC command.

Table 4 RTRV-TACC Parameters

Parameter
Definition

<TAP>

The assigned number for the AID being used as a TAP. TAP is an integer.

<TACC_AIDA>

The A path of the TAP, i.e., the first STS/VT path of the TAP

<TACC_AIDB

The B path of the TAP, i.e., the second STS/VT pat of the TAP. For a single FAD TAP this path will be empty.

<MD>

The test access mode. It identifies the mode of access between the TAP and the circuit connected to the TAP. MD is optional.

<CrossConnectId1>

The E path of the cross-connect. CrossConnectId1 is optional.

<CrossConnectId2>

The F path of the cross-connect. CrossConnectId2 is optional.


Disconnect a TAP

DISC-TACC

DISC-TACC:[<TID>]:<TAP>:<CTAG>;

Disconnect the <TAP> and put the connection back to it's original state (no access).

Table 5 shows the error codes supported by the DISC-TACC command.

Table 5 Supported Error Codes for DISC-TACC

Error Code
Definition

SADC

ALREADY DISCONNECTED

SRTN

UNABLE TO RELEASE TAP


Figure 3 DISC-TACC::1:12;

DV9-99 1970-01-02 02:59:43
M 12 COMPLD
;


Note This disconnects TAP 1 from the circuit/cross-connect under test.



Note This command generates a REPT DBCHG message.


3 Test Access Configurations

Figure 4 Single node view (Node 1)

ED-VC4::VC4-1-1-1:90:::TACC=1;

Changes VC4 1 & VC4 2 on slot 1 to a TAP. The CTAG is 90. Sets the TAP number to 1.

CONN-TACC-VC4::<AID for E or F depending on md>:91::1:MONE

Connects the <AID> to the TACC defined by TAP 1 on the E side. CTAG is 91


Note The connection made in the CONN-TACC command may use MONE to connect to the F side <AID>. The <AID> provided designates the E side and the other automatically becomes the F side. For example if an <AID F> is supplied to a MONE connection then the top line would be connected to the other side of the path, or what is shown in the diagram as the F side. Once a CONN-TACC is setup these designations cannot change until a DISC-TACC or another CONN-TACC command is executed. The connection is really based on the <AID> supplied.


Figure 5 Multi-node view (MONE example)

On NE3

ENT-CRS-VC4::<AID I-G>:100::2WAY; A connection, not a TAP. CTAG is 100.

ENT-CRS-VC4::<AID J-H>:101::2WAY; Second connection, not a TAP;

On NE1

Assuming the path from A to B is already entered. The A and B points in the diagram refer to entry and exit points on the node or different cards. The E/F designators refer to the two 2-way connections from NE3.

ED-VC4::VC4-1-1-1:D:::TACC=4; Creates TAP with VC4-1-1-1 and VC4-1-1-2 through NE1. TAP number assigned is 4.

CONN-TACC-VC4::<AID A or B>:102::4:<MD> connects TAP 4 to the circuit.


Note The I and J connections above are TAPS in figure 1 but normal connections in this configuration.


Test Access Mode Definitions

The following diagrams show what the different test access modes <MD> refer to. Figure 6 shows a circuit with no access (dual FAD TAP), Figure 7 shows a circuit with no access (single FAD TAP), followed by all the modes. The QRS may be generated by an outside source, i.e. the empty connection of the BRTU.

Intrusive and Non-Intrusive Modes

MONE, MONF, and MONEF access modes are non-service effecting and can be applied to an IS (in service) port state.

LOOPE, LOOPF, SPLTE, SPLTF, SPLTEF, SPLTA, SPLTB, and SPLTAB access modes are intrusive and only be applied to a circuit/port that is in the OOS_MT (out of service, maintenance) port state. The NE will change the state of the circuit under test to OOS_MT during the period of TACC and restore it to the original state once the connection between the TAP and the circuit is dropped.

Figure 6 Circuit with no access (dual FAD TAP)

Figure 7 Circuit with no access (single FAD TAP)

MONE

Monitor E (MONE) indicates a monitor connection provided from the facility access digroup (FAD) to the A transmission path of the accessed circuit (Figure 8 and Figure 9). This is a non-intrusive mode.

Figure 8 MONE access single TAP

Figure 9 MONE access dual TAP

MONF

Monitor F (MONF) indicates that the FAD is providing a monitor connection to the B transmission path of the accessed circuit (Figure 10 and Figure 11). This is a non-intrusive mode.

Figure 10 MONF access single TAP

Figure 11 MONF access dual TAP


Note The MONE and SPLTA modes are applicable to unidirectional circuits from E to F. The MONF and SPLTB modes are applicable to unidirectional circuits from F to E.


MONEF

Monitor EF (MONEF) is a monitor connection provided from the FAD1 (odd pair) to a DFAD, to the A transmission path and from FAD2 (even pair) of the same DFAD, to the B transmission path of the accessed circuit (Figure 12). This is a non-intrusive mode.

MONEF for T3 (DS3 HCDS) indicates that the odd pair of a FAP is providing a monitor connection to the A transmission path and from the even pair of a facility access path (FAP) to the B transmission path of the accessed circuit.

Figure 12 MONEF access dual TAP

SPLTE

Split E (SPLTE) indicates to split both the A and B paths and connect the E side of the accessed circuit to the FAD (Figure 13 and Figure 14).

Figure 13 SPLTE access single TAP

Figure 14 SPLTE access dual TAP

SPLTF

Split F (SPLTF) indicates to split both the A and B paths and connect the F side of the accessed circuit to the FAD (Figure 15 and Figure 16).

Figure 15 SPLTF access single TAP

Figure 16 SPLTF access dual TAP

SPLTEF

Split EF (SPLTEF) for T1 (DS1 HCDS) indicates to split both the A and B paths, connect the E side of the accessed circuit to FAD1 and the dual facility access digroup (DFAD) pair, and connect the F side to the FAD2 of the same DFAD pair. SPLTEF for T3 (DS3 HCDS) indicates to split both the A and B paths and connect the E side of the accessed circuit to the odd pair of the FAP and the F side to the even pair of the FAP (Figure 17).

Figure 17 SPLTEF access dual TAP

LOOPE

Loop E (LOOPE) indicates to split both the A and B paths, connect the incoming line from the E direction to the outgoing line in the E direction, and connect this looped configuration to the FAD (Figure 18 and Figure 19). Loop E and F modes are basically identical to the SPLT E and F modes except that the outgoing signal is the incoming signal and not the signal from the remote test unit (RTU).

Figure 18 LOOPE access single TAP

Figure 19 LOOPE access dual TAP

LOOPF

Loop F (LOOPF) indicates to split both the A and B paths, connect the incoming line from the F direction to the outgoing line in the F direction and connect this looped configuration to the FAD (Figure 20 and Figure 21).

Figure 20 LOOPF access single TAP

Figure 21 LOOPF access dual TAP

SPLTA

Split A (SPLTA) indicates that a connection is provided from both the E and F sides of the A transmission path of the circuit under test to the FAD and split the A transmission path (Figure 22 and Figure 23). These modes are similar to the Split E and F modes, except the signals are sent to the RTU, not the NE signal configuration.

Figure 22 SPLTA access single TAP

Figure 23 SPLTA access dual TAP

SPLTB

Split B (SPLTB) indicates that a connection is provided from both the E and F sides of the B transmission path of the circuit under test to the FAD and split the B transmission path (Figure 24 and Figure 25).

Figure 24 SPLTB access single TAP

Figure 25 SPLTB access dual TAP

4 Unmapped AID TAP Connections

The Cisco ONS 15454 SDH also supports connections to unmapped AIDs (unmapped circuits). The TAPs can be connected to an unmapped AID (an AID that does not have a cross-connect on it). The access modes supported are MONE, SPLTE and LOOPE. Example 12 creates a TAP on VC4-5-1-1.

Example 12 ED-VC4::VC4-5-1-1:12:::TACC=1;

DV9-99 1970-01-02 03:16:11
M 12 COMPLD
;

Example 13 creates an unmapped AID connection with a MONE access mode. VC4-5-1-3 does not have a cross-connect on it. VC4-5-1-3 becomes unusable until the connection is disconnected by the DISC-TACC command.

Example 13 CONN-TACC-VC4::VC4-5-1-3:12::1:MD=MONE;

DV9-99 1970-01-02 02:51:54
M 12 COMPLD
1
;

Table 6 Modes Supported by Circuit Type 

Circuit Type (Direction)
MONE
MONF
MONEF
SPLTE
SPLTF
SPLTEF
LOOPE
LOOPF
SPLTA
SPLTB

1-way (from E)

X

             

X

 

1-way (from F)

 

X

             

X

2-way

X

X

X

X

X

X

X

X

X

X

SNCP

X

X

X

X

X

X

X

X

X

X

SNCP_HEAD (from E)

X

             

X

 

SNCP_HEAD (from F)

 

X

             

X

SNCP_DROP
SNCP_DC
SNCP_EN
(from E)

X

             

X

 

SNCP_DROP
SNCP_DC
SNCP_EN
(from F)

 

X

             

X

SNCP_SNCP

X

X

X

X

X

X

X

X

X

X

Unmapped AID

X

   

X

   

X

     

Notes:

1. The <AID> provided in the CONN-TACC command designates the E side and the other automatically becomes the F side.

2. In the case of all 1-way circuits (1-way, SNCP_HEAD, SNCP_DROP,SNCP_DC, SNCP_EN):

a. If the AID specified is the source AID, the direction is designated as from E in the above table.

b. If the AID specified is the destination AID or the drop side, the direction is designated as from F in the above table.

5 Parameter Types

TACC_MODE

Test access mode

Table 7 TACC_MODE 

Values
Description

LOOPE

Indicates to split both the A and B paths, connect the line incoming from E direction to the line outgoing in the E direction, and connect this looped configuration to the FAD. The line outgoing in the F direction shall have a QRS connected, and the line incoming from the F direction shall be terminated by the nominal characteristic impedance of the line.

LOOPF

Indicates to split both the A and B paths, connect the line incoming from F direction to the line outgoing in the F direction, and connect this looped configuration to the FAD. The line outgoing in the E direction shall have a QRS connected, and the line incoming from the E direction shall be terminated by the nominal characteristic impedance of the line.

MONE

Indicates that a monitor connection is to be provided from the FAD to the A transmission path of the accessed circuit.

MONEF

Indicates that a monitor connection is to be provided from the FAD1 to a DFAD, or the odd pair of a FAP, to the A transmission path and from FAD2 of the same DFAD, or the even pair of a FAP, to the B transmission path of the accessed circuit.

MONF

Indicates that a monitor connection is to be provided from the FAD to the B transmission path of the accessed circuit.

SPLTA

Indicates that a connection is to be provided from both the E and F sides of the A transmission path of the circuit under test to the FAD and split the A transmission path.

SPLTB

Indicates that a connection is to be provided from both the E and F sides of the B transmission path of the circuit under test to the FAD and split the B transmission path.

SPLTE

Indicates to split both the A and B paths and connect the E side of the accessed circuit to the FAD. The line outgoing in the F direction shall have a QRS connected, and the line incoming from the F direction shall have a QRS connected, and the line incoming from the E direction shall be terminated by the nominal characteristic impedance of the line.

SPLTEF

Indicates to split both the A and B paths, and connect the E side of the accessed circuit to FAD1 and the F side to FAD2.

SPLTF

Indicates to split both the A and B paths, and connect the F side of the accessed circuit to the FAD. The line outgoing in the E direction shall have a QRS connected, and the line incoming in the E direction shall have a QRS connected, and the line incoming from the E direction shall be terminated by the nominal characteristic impedance of the line.


MOD_TACC

Test access modifier

Table 8 MOD_TACC Values 

Values
Description

DS3I

DS3I path

E1

E1 facility/line

E3

E3 facility/line

VC3

VC3 path

VC44C

VC44C path

VC464C

VC464C path

VC48C

VC48C path

VC4

VC4 path

VC416C

VC416C path

VC42C

VC42C path

VC43C

VC43C path

VC11

VC11 path

VC12

VC12 path


TAPTYPE

Test access path/point type

Table 9 TAPTYPE Values 

TAPTYPE Values
Description

DUAL

Dual-FAD type

SINGLE

Single-FAD type


6 Test Access Terminology

BRTU—Broadband remote test unit

DFAD—Dual facility access digroup

FAD—Facility access digroup

FAP—Facility access path

LOOPE—Split/loop access on A and B paths equipment side

LOOPF—Split/loop access on A and B paths facility side

MONE—Monitor access with signal detector on A path

MONF—Monitor access with signal detector on B path

MONEF—Monitor access with signal detector on A and B paths

QRS—Quasi-random signal (bit test pattern)

RTU—Remote test unit

SPLTA—Split access on A path with signal detector from equipment, QRS on facility side

SPLTB—Split access on B path with signal detector from equipment, QRS on equipment side

SPLTE—Split access on A and B paths with signal detector from equipment, QRS on equipment side

SPLTF—Split access on A and B paths with signal detector from equipment, QRS on facility side

SPLTEF—Split access on A and B paths for testing in both equipment and facility directions

TACC—Test access

TAP—Test access path/point

SDH—Synchronous digital hierarchy

VC-11—Virtual container level 1 type 1. An SDH lower-order path. Equivalent to a VT-1.5 in SONET.

VC-12—Virtual container level 1 type 2. An SDH lower-order path. Equivalent to a VT-2 in SONET.

VC-3—Virtual container level 3. An SDH lower-order path.

VT1—Virtual tributary 1

Path Naming Conventions:

E—Equipment test access point direction

F—Facility test access point direction

A—Transmission path (the direction of transmission on the A pair is from E to F)

B—Transmission path (the transmission direction for the B pair is from F to E)