Cisco ONS 15454 SDH TL1 Command Guide, Release 6.0
Chapter 5, CHG Commands
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CHG Commands

Table Of Contents

CHG Commands

5.1  CHG-ACCMD-<MOD_TACC>


CHG Commands


This chapter provides CHG (change) commands for the Cisco ONS 15454 SDH.

5.1  CHG-ACCMD-<MOD_TACC>

Change Test Access Mode (DS3I, E1, E3, VC3, VC44C, VC38C, VC464C, VC48C, VC36C, VC4, VC416C, VC42C, VC43C, VC11, VC12)

Usage Guidelines

See Table 27-1 on page 27-1 for supported modifiers by platform.

This command changes the test access (TACC) mode for the circuit being tested. For more information on TACC, refer to the Cisco ONS 15454 SDH TL1 Reference Guide.

This can be a change from monitoring the data to inserting data into the VC. This command can only be applied to an existing TAP connection.

For this command to be applicable, you must first create the TAP using the ED-<VC_PATH> or ED-VC12 command. Intrusive test access modes are traffic-affecting. If a facility/path is connected to a TAP in an intrusive test access mode, it is forced to go into the Locked-Maintenance state. The forced transition could be traffic-affecting. The present state of the facility/path is stored by the NE and is restored when the TAP connection is brought down. Test access connections are dropped automatically if the TL1 session is terminated or is timed out.

The following actions will return error messages:

No TAP connection will return a DENY error message.

If a requested condition already exists a SRCN error message is returned.

If a requested access configuration is invalid a SRAC error message is returned.

If a requested TAP does not exist a RTEN error message is returned.

Category

Troubleshooting and Test Access

Security

Maintenance

Related Commands

CONN-TACC-<MOD_TACC>

DISC-TACC

RTRV-TACC


Input Format

CHG-ACCMD-<MOD_TACC>:[<TID>]:<TAP>: <CTAG>::<MD>;

Input Example

CHG-ACCMD-VC3:CISCO:8:123::MONE;

Input Parameters

Table 5-1 CHG-ACCMD-<MOD_TACC> Input Parameters 

Parameter and Values
Description

TAP

The Test Access Path number. TAP number must be an integer with a range of 1 to 999. String

Note This command only supports changing the mode for a single TAP number at a time.

MD

The test access mode. (SPLTE, SPLTF, LOOPE and LOOPF require an external QRS input signal.) Single FAD Test Access does not support MONEF, SPLTEF & SPLTAB modes

Parameter type is TACC_MODE—test access mode

LOOPE

Indicates to split both the A and B paths. Connect the line incoming from E direction to the line outgoing in the E direction, and connect this looped configuration to the FAD. The line outgoing in the F direction shall have a QRS connected, and the line incoming from the F direction shall be terminated by the nominal characteristic impedance of the line. Intrusive test access mode

LOOPF

Indicates to split both the A and B paths. Connect the line incoming from F direction to the line outgoing in the F direction, and connect this looped configuration to the FAD. The line outgoing in the E direction shall have a QRS connected, and the line incoming from the E direction shall be terminated by the nominal characteristic impedance of the line. Intrusive test access mode

MONE

Indicates that a monitor connection is to be provided from the FAD to the A transmission path of the accessed circuit

MONEF

Indicates that a monitor connection is to be provided from the FAD1 to a DFAD, or the odd pair of a FAP, to the A transmission path and from FAD2 of the same DFAD, or the even pair of a FAP, to the B transmission path of the accessed circuit.

MONF

Indicates that a monitor connection is to be provided from the FAD to the B transmission path of the accessed circuit.

SPLTA

Indicates that a connection is to be provided from both the E and F sides of the A transmission path of the circuit under test to the FAD and split the A transmission path. Intrusive test access mode

SPLTB

Indicates that a connection is to be provided from both the E and F sides of the B transmission path of the circuit under test to the FAD and split the B transmission path. Intrusive test access mode

SPLTE

Indicates to split both the A and B paths and connect the E side of the accessed circuit to the FAD. The line outgoing in the F direction shall have a QRS connected, and the line incoming from the F direction shall have a QRS connected, and the line incoming from the E direction shall be terminated by the nominal characteristic impedance of the line. Intrusive test access mode

SPLTEF

Indicates to split both the A and B paths, and connect the E side of the accessed circuit to FAD1 and the F side to FAD2. Intrusive test access mode

SPLTF

Indicates to split both the A and B paths, and connect the F side of the accessed circuit to the FAD. The line outgoing in the E direction shall have a QRS connected, and the line incoming in the E direction shall have a QRS connected, and the line incoming from the E direction shall be terminated by the nominal characteristic impedance of the line. Intrusive test access mode